With the Empyrean, PANalytical has set the new standard for a multipurpose diffractometer. In developing the ultimate X-ray platform for the analysis of powders, thin films, nanomaterials and solid objects, the PANalytical R&D team has redesigned all key components of the X-ray diffractometer from the ground up.

It is PANalytical's answer to the challenges of modern materials research, where the lifetime of a diffractometer is considerably longer than the horizon of any research project.

Empyrean is a true multi-purpose research diffractometer. Like no other system available, the Empyrean platform is designed for now, and for years to come.

Empyrean

Empyrean

智能X射线衍射仪

更多细节
测量 Crystal structure determination, 物相鉴定, Phase quantification, Contaminant detection and analysis, Residual stress, Epitaxy analysis, Interface roughness, 织构分析, 3D structure / imaging, Reciprocal space analysis
测角仪配置 Vertical goniometer, Θ-Θ
粒度范围 1 - 100 nm
技术类型 X-ray Diffraction (XRD)

Empyrean Nano 版

Empyrean Nano 版

多功能 X 射线散射平台

更多细节
测量 分子 量, 颗粒形状, 颗粒粒度, 比表面积, 蛋白质团聚, Protein stability, 物相鉴定, Phase quantification, Pore size distribution
测角仪配置 Vertical goniometer, Θ-Θ
粒度范围 1 - 100 nm
技术类型 X-ray Diffraction (XRD), X-ray Scattering

Empyrean 锐影 Alpha 1

Empyrean 锐影 Alpha 1

实验室 XRD 系统的出众数据质量

更多细节
测量 Crystal structure determination, 物相鉴定, Phase quantification, 3D structure / imaging
测角仪配置 Vertical goniometer, Θ-Θ
技术类型 X-ray Diffraction (XRD)

Empyrean

Empyrean

智能X射线衍射仪

Empyrean Nano 版

Empyrean Nano 版

多功能 X 射线散射平台

Empyrean 锐影 Alpha 1

Empyrean 锐影 Alpha 1

实验室 XRD 系统的出众数据质量

更多细节 更多细节 更多细节
测量 Crystal structure determination, 物相鉴定, Phase quantification, Contaminant detection and analysis, Residual stress, Epitaxy analysis, Interface roughness, 织构分析, 3D structure / imaging, Reciprocal space analysis 分子 量, 颗粒形状, 颗粒粒度, 比表面积, 蛋白质团聚, Protein stability, 物相鉴定, Phase quantification, Pore size distribution Crystal structure determination, 物相鉴定, Phase quantification, 3D structure / imaging
测角仪配置 Vertical goniometer, Θ-Θ Vertical goniometer, Θ-Θ Vertical goniometer, Θ-Θ
粒度范围 1 - 100 nm 1 - 100 nm  
技术类型 X-ray Diffraction (XRD) X-ray Diffraction (XRD), X-ray Scattering X-ray Diffraction (XRD)