HiPer Small Spot Mapping is the latest addition to the Zetium platform and its SumXcore technology - an integration of WDXRF, EDXRF and XRD.
With the unique X-ray optics of HiPer Small Spot Mapping, measurement times can be reduced by up to 80%. This puts the Zetium in a class of its own with respect to analytical power, speed and task flexibility in a wide range of environments.
- Small spot mapping available on your spectrometer for production control
- Inclusion analysis in just minutes or map over 100 mm2 in only a few hours
- Cover Na to Am and screen for unexpected elements
- Schedule and run small spot mapping on sample batches