Reduce analysis times by up to 80% for inclusions and elemental mapping

HiPer Small Spot Mapping is the latest addition to the Zetium platform and its SumXcore technology - an integration of WDXRF, EDXRF and XRD.

With the unique X-ray optics of HiPer Small Spot Mapping, measurement times can be reduced by up to 80%. This puts the Zetium in a class of its own with respect to analytical power, speed and task flexibility in a wide range of environments.

  • Small spot mapping available on your spectrometer for production control
  • Inclusion analysis in just minutes or map over 100 mm2 in only a few hours
  • Cover Na to Am and screen for unexpected elements
  • Schedule and run small spot mapping on sample batches


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