马尔文帕纳科 X 射线衍射仪用于获取高质量的衍射数据,它结合了易用性与快速切换到其他应用的灵活性。
Aeris
Prepare to be surprised by our highly accurate, fast XRD system. Precise results can be ready in less than five minutes.
Download the brochure - In-operando XRD battery research and quality control solutions. Download now
Download nowPrepare to be surprised by our highly accurate, fast XRD system. Precise results can be ready in less than five minutes.
Our newly designed MultiCore Optics enable the largest variety of measurements without any manual intervention.
The long and successful history of our Materials Research Diffractometers continues with a new generation of X'Pert³.
Our Crystal Orientation solutions are designed with boule, ingot, puck and wafer applications in mind.
AerisCompact X-ray diffractometer |
Empyrean 锐影系列Multipurpose X-ray diffractometer |
X'Pert³ 系列X射线衍射仪Thin Film Analysis XRD Systems |
Crystal orientation rangeFast and accurate orientation of wafers and ingots |
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技术类型 | ||||
X 射线衍射 (XRD) | ||||
测量类型 | ||||
颗粒形状 | ||||
粒子大小 | ||||
晶体结构测定 | ||||
物相鉴定 | ||||
物相定量 | ||||
污染物检测与分析 | ||||
外延附生分析 | ||||
界面粗糙度 | ||||
3D 结构/成像 | ||||
薄膜测量 | ||||
残余应力 | ||||
Crystal orientation | ||||
Cleanroom ISO 4 | ||||
SECS/GEM |