Introduction to NIR 

Near-infrared reflectance spectroscopy NIR (or NIRS) is a highly flexible form of analysis, which can be applied to a broad range of research and industrial process applications. Long a staple technology in remote sensing, NIR reflectance spectroscopy has become popular within industrial markets as a cost-effective tool for measuring materials to optimize processes and manage costs.

What is NIR and how does it work?

NIRS near infrared reflectance spectroscopy is a method that makes use of the near infrared region of the electromagnetic spectrum (from about 700 to 2500 nanometers). By measuring light scattered off of and through a sample, NIR reflectance spectra can be used to quickly determine a material’s properties without altering the sample.

NIR converts measured data into actionable information to help optimize processes or improve research. Capable of examining irregular surfaces with the same ease as a carefully prepared sample, NIR is non-destructive, and requires little or no sample preparation. It can also be used to analyze multiple constituents in a single scan.  

Advantages of near infrared spectroscopy

  • Highly flexible form of analysis 
  • Cost-effective
  • Capable of examining irregular surfaces
  • Non-destructive
  • Requires little or no sample preparation

ASD FieldSpec range

ASD LabSpec® 系列

ASD TerraSpec® Halo Mineral Identifier

ASD TerraSpec® 4 Hi-Res 矿物光谱仪

ASD QualitySpec® Trek 便携式光谱仪

ASD QualitySpec® 7000 在线检测光谱仪

ASD FieldSpec range ASD LabSpec® 系列 ASD TerraSpec® Halo Mineral Identifier ASD TerraSpec® 4 Hi-Res 矿物光谱仪 ASD QualitySpec® Trek 便携式光谱仪 ASD QualitySpec® 7000 在线检测光谱仪

The Gold Standard in Field Spectroradiometers

用于定性和定量材料分析的实验室仪器

Portable full-range handheld spectrometer that is fast, accurate, and easy to use for the exploration geology market

快速、精确的矿物勘探

便携式全范围手持光谱仪,测量快速、准确且易于使用

设计用于测量输送系统上传输的工艺材料

更多细节 更多细节 更多细节 更多细节 更多细节 更多细节
测量类型
Remote sensing
Ground truthing
分子结构
技术类型
Near-infrared Spectroscopy (NIR)
Crystallinity determination - Quantification of low amounts of amorphous material in a crystalline matrix and vice versa

Application Note

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