Aeris 携手 X 射线反射率测量:轻松测量薄膜和表面粗糙度. 了解更多

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Aeris

Floor standing data quality all in one benchtop XRD system

Precise XRD results, every time. Ready for any application. Designed for simplicity.

Floor-standing performance. Benchtop Simplicity.

High-performance laboratories need reliable answers without a large instrument footprint. Aeris delivers floor-standing X-ray diffraction data quality in just a third of the space, with higher throughput and wider angular coverage driving faster results. Cleaner operation. Lower detection limits. Scalable automation and modularity to handle a diverse range of applications.

Floor-standing data quality in a fraction of the footprint

Aeris’s unique design and high-end detector technology deliver powder diffraction data quality comparable to that of floor-standing systems, in only 37% of the lab space.

High-throughput XRD

By extending angular coverage by up to 70% versus competing systems, our 0D, 1D and 2D detectors capture more data per exposure, enabling up to 1.7× higher throughput at equivalent power. 

Cleaner loading, protected results

External loading gives 0 opportunity to spill powder inside the measurement chamber, helping protect the optical path, support cleaner day-to-day operation and allow for faster sample recovery.

Focus on what matters

By boosting signal-to-noise and reducing fluorescence background beyond conventional low-energy discrimination, you can lower detection limits with confidence and focus on what truly matters in your sample.

Additional measurement modes for versatile operation

Designed for multi-purpose operation, Aeris’s modular design allows it to adapt to changing priorities with optional add-on capabilities that enhance its capabilities and safeguard your investment.

Powder X-ray diffraction

Identify phases, crystal structure and the composition of powders in a rapid, non-destructive manner.

X-ray reflectometry

Measure the thickness, density, and roughness of both single-layer and multi-layer thin films.

Grazing incidence X-ray diffraction

Reveal surface structure and thin-film properties by probing only the topmost layers of a material.

Transmission X-ray diffraction

Probe bulk structure of low atomic number, weakly absorbing materials and minimize preferred orientation effects and avoids the specimen-displacement and transparency errors often yielding more representative intensities and peak profiles.

Non-ambient

Examine your materials under real process conditions.

2D diffraction

Reveal sample effects like spottiness before reducing your data – all in a simple workflow.

High throughput with half the workload with the High-Capacity Sample Changer

The Aeris High-Capacity Sample Changer offers over 60 sample positions, enabling automated, continual, even overnight operation while cutting operator workload.

High throughput

Applications

Hands-off precision, non-stop throughput

Couple Aeris XRD up with Zetium XRF for ultimate material understanding and throughput, with our dedicated Twin Solution.

Automation

附件

Aeris’s accessories, detectors and software packages are designed to enhance performance and to provide ultimate flexibility.

智能管理器准备就绪。

通过 Smart Manager 软件内置正常运行时间智能。全天候光谱仪运行状况监控,保障正常运行时间。

仪器监控

参数指标

样品加载 External sample loading
Sample holders Variety of full-sized sample holders capable meeting all requirements
样品更换 Choose between a manual loading dock, 6-position sample changer, or 67-position high-capacity sample changer
自动化 Compatible with automation integration

Protect performance with planned support

Access flexible service agreements designed to keep your instrument running at its best throughout its full life cycle.

Services & support

刊物

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Experience floor-standing XRD quality in a benchtop platform.

Get precise results, every time, with maximum simplicity, thanks to:

  • 1.7× higher throughput at equivalent power to competitors
  • 100% external sample loading
  • 8× higher signal quality
  • Modular design for multi-purpose operation