Claisse provides its customers with quality Certified Reference Materials (CRM) and Reference Materials (RM) from around the world at competitive prices. Whatever your needs, Claisse strives to provide you with the all around services needed to obtain the perfect solution for your XRF, AA and ICP spectroscopy analysis.
Epsilon 3XLE is a benchtop energy dispersive X-ray fluorescence (EDXRF) spectrometer that is used for elemental analysis from carbon (C) to americium (Am) in areas from R&D through to process control. Easy to operate, reliable and highly flexible, it is ideally suited to a broad range of industries and applications. The instrument is powered by the latest advances in excitation and detection technology, delivering excellent analytical performance.
The SDDUltra silicon drift detector fitted in Epsilon 3XLE enables ultra light element analysis of even carbon, nitrogen and oxygen.