Collecting and analyzing powder XRD patterns: Advanced workshop on Rietveld, PDF and in-situ analysis

Collecting good powder diffraction patterns is paramount when publishing in a reputable journal. In order to get a high-quality powder pattern, it is important to understand the influencing factors. For instance, how changes to the structure and sample preparation can cause XRD peak shifts. Even changing the unit cell or changes to the inside of the unit cell can influence the powder pattern. Upon collection of good powder patterns, researchers are challenged with how to conduct quantitative phase analysis.

Malvern Panalytical teams up with the Chapter of Singapore Crystallographers yet again for another installation of X-ray diffraction (XRD) data analysis and interpretation related workshops.

Advanced XRD workshop: Rietveld, PDF and in-situ data analysis and interpretation

12-13 Dec, Nanyang Technological University Singapore, The Arc

Register now

What you will learn during the workshop:

  1. Improve your foundational knowledge: how to collect good quality powder diffraction pattern
  2. How to conduct qualitative phase analysis, including Rietveld refinement
  3. Learn about other advanced XRD experiments involving PDF and in-situ research
  4. Get hands-on time to analyze samples on an X-ray diffractometer as well as other complementary analytical techniques like particle size distribution when grinding as well as elemental analysis for better phase search mapping
  5. Receive a free demo license of the HighScore Plus XRD software quantification with or without the Rietveld method, profile fitting, or pattern treatment and more
  6. Extended program to 2 days for more discussions and hands-on learning

Speakers include:

  • Dr. Samuel Morris, from the Chapter of Singapore Crystallographers and Research Fellow at NTU FACTS Laboratory
  • Dr. Martin Schreyer Martin Schreyer, applications specialist from Malvern Panalytical’s Supply Center in the Netherlands, who has a speciality in phase quantification and in-situ research
  • Dr. Umesh Tiwari, Global Manager for Advanced Materials who has a speciality in the treatment of powder patterns as well as thin-film research

Registration is free – because we believe in continual education. Limited spaces, so please register asap.

Interested in similar data analysis and interpretation initiatives?

This workshop takes place the weekend before the 16th Conference of the Asian Crystallographic Association (AsCA). We welcome any delegate who is attending AsCA to attend this workshop free of charge. Malvern Panalytical is a proud gold sponsor of AsCA 2019. During AsCA, we bring to you interactive activities:

  1. Unveiling of new and intelligent technologies for shared research facilities
  2. Free workshop on 19th Dec: Hard radiation and PDF research, Global Learning Center, National University of Singapore’s U Town

Malvern Panalytical is at #booth 4. For more information about our initiatives, click here.