Grazing incidence small-angle X-ray scattering (GISAXS) is a surface sensitive method for investigating nanostructure in thin films. GISAXS data provide information about nanostructure dimensions, distributions and structural ordering in thin films.
GISAXS was once considered a method exclusive to synchrotron beam lines, and made its way towards dedicated laboratory instruments. Now the Medipix2 detector with photon-counting technology enables PANalytical’s PIXcel3D area detectors to collect noise-free images, making good use of lab source intensities to obtain high quality images on the Empyrean multi-purpose diffractometer.
In this webinar there will be an introduction to GISAXS technique together with few application examples.
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Panelist Information:
Fabio Masiello studied Physics at the University of Turin (Italy), followed by a PhD in Physics and Material Science obtained from the Universities of Grenoble and Turin while working at the ESRF. Fabio then joined PANalytical in 2011 as Application Specialist XRD, in Almelo (The Netherlands). From 2012 he is the Product Manager responsible for the Empyrean diffractometer.