In the past quality control in a cement plant was performed on samples delivered to the laboratory for measurement. The results were reported back hours, or even days, later. Due to this delay, the data had limited value for process control. More recently, on-line and at-line instrumentation have enabled rapid analysis and feedback, supporting significantly improved process control. As cement ...
- 产品:
- Zetium, CNA Pentos, Aeris Cement edition
- 技术类型:
- X 射线荧光 (XRF), 脉冲快热中子活化分析, X 射线衍射 (XRD)
- 行业应用:
- 建筑材料, 水泥