Are you looking forward to the conference season or completing papers ready for publication? You may want to finish your dissertation or thesis, or simply analyze your latest XRD measurements.

Since many of us are now working from home and access to the lab can be restricted, we’d like to help you to progress your XRD projects by providing you with some free software licenses for our XRD packages HighScore Plus and AMASS. 

You may be leading a group of researchers who are new to XRD and need time to learn or who may be familiar with HighScore or AMASS, and just need their own license at home. 

Your team may be new to the software and are interested in what it might offer you. Now is the chance to experience it in your own time and enable you to work faster, look deeper, or expand your XRD knowledge.

We’re offering free 12-month licenses for use by up to 3 of your research team. Simply apply here!

If you have more questions, don’t be afraid to Contact Us!

HighScore Plus Software

For polycrystalline materials, whether you are interested in improved process control, or doing research and development, understanding your materials starts very often with understanding the powder diffraction pattern.

After identification of all phases present in your sample with Malvern Panalytical’s HighScore with the Plus Option this all-in-one software suite continues to support you with your analysis. 

Whether your focus is on quantification with or without the Rietveld method, profile fitting, or pattern treatment; HighScore Plus is the solution and helps you perform your daily analyses. 

Want to find out more about using this software package? 

Check out our recommended HighScore (Plus) videos

Look at our Webinars on demand:

Register for our Ask an Expert! webinars you may be interested in: 

AMASS Software

Advanced Material Analysis and Simulation Software (AMASS) provides comprehensive functionality for displaying, analyzing, simulating, and fitting X-ray scattering data from nano-layered structures. Reflectometry methods provide you with information about film thicknesses, densities together with surface and interface roughness. High resolution methods such as rocking curves, 2-axes scans, reciprocal space maps allow you to obtain strain and composition measurements from epitaxial layer structures. 

These and similar thin films are commonly researched for example in electronics and photovoltaics applications in a variety of devices ranging from LEDs and displays to solar cells and power electronics for mobile phones and telecommunications.

Want to find out more about using this software package? Look at our Webinars on demand!

Register for our upcoming Ask an Expert! webinars - you may be interested in:

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