This application note demonstrates Omnian’s ability, using the Epsilon 3XLE, to deal with the challenge of finite thickness (FT) in thin samples and fluorescence volume geometry (FVG) effect in thicker low density samples.
Relatively thin samples present problems for conventional XRF analysis, because the relationship between count rate and concentration can be significantly influenced by sample thickness. Omnian corrects for this effect by applying a Fundamental Parameter (FP)-based FT correction.
