This application note shows that the Semyos micro X-ray fluorescence spectrometer is easily capable of analyzing CoNiFe films used in the manufacturing of read/write heads for hard drives.
Since the last decade, the read/write head technology used in hard drives has been advancing at an incredible pace, resulting in formidable information densities that are currently achieved for state-of-the-art hard drives. A major part of these developments has been targeted at the read/write head assembly, which meanwhile has become the most complex and expensive part of the drive.
