| 00:00:00 | Avoiding common measurement pitfalls |
| 00:03:26 | Agenda |
| 00:04:41 | The basics |
| 00:05:59 | Laser diffraction examples |
| 00:06:07 | Laser diffraction |
| 00:07:10 | Laser diffraction: light scattering |
| 00:07:43 | Mastersizer 3000 optics: red light measurements |
| 00:08:41 | First steps |
| 00:09:42 | When doesn’t it |
| 00:11:34 | Build up |
| 00:13:24 | Also influences the PSD |
| 00:13:41 | How would you fix this |
| 00:14:04 | The background also needs to be stable |
| 00:15:12 | This will…. |
| 00:15:25 | How much sample to add? |
| 00:16:00 | How much sample to add? |
| 00:17:12 | How does this change the result? |
| 00:18:31 | The sample also needs to be stable |
| 00:20:46 | Change the solvent |
| 00:21:56 | Also watch out for |
| 00:22:21 | And in the dry… |
| 00:22:34 | Other things to bear in mind |
| 00:23:38 | Dynamic Light Scattering |
| 00:24:20 | DLS Instrument Components |
| 00:24:52 | Intensity Fluctuations and Brownian Motion |
| 00:25:28 | Correlation in Dynamic Light Scattering |
| 00:25:47 | Correlation |
| 00:26:00 | Correlation |
| 00:26:28 | Correlation |
| 00:26:47 | Correlation Functions |
| 00:27:08 | The correlogram |
| 00:29:50 | Need a consistent signal |
| 00:31:27 | Poor signal to noise |
| 00:32:19 | Multiple scattering |
| 00:33:15 | Fluorescence |
| 00:34:04 | DLS – Intensity based |
| 00:34:48 | Conclusions |
| 00:35:38 | Thank you for your attentionQuestion & Answer SessionListening live:Ask your question by typing within the Q & A dialog boxListening on-demand:Send your questions toevents@malvernpanalytical.com |
What are the most common mistakes made by scientists using technologies such as laser diffraction and dynamic light scattering to measure particle size?
How can these mistakes be avoided?
How can some of the most common causes of poor reproducibility be used to create experiments to validate your method?
This webinar will focus on the issues of unstable samples, poor backgrounds and poor analysis choices. None of these issues are complex, and awareness of potential issues and how to avoid them will result in significant improvements in the quality of your measurements.
演讲嘉宾
Steve Ward-Smith - Key Account Technical Specialist
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Who should attend?
Those actively using or considering using laser diffraction or dynamic light scattering to measure particle size for any application.
Scientists who want to improve the quality, speed and reliability of their particle sizing measurements, speeding their processes and making better products.