How to avoid common pitfalls when measuring particle size

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00:00:00 Avoiding common measurement pitfalls
00:03:26 Agenda
00:04:41 The basics
00:05:59 Laser diffraction examples
00:06:07 Laser diffraction
00:07:10 Laser diffraction: light scattering
00:07:43 Mastersizer 3000 optics: red light measurements
00:08:41 First steps
00:09:42 When doesn’t it
00:11:34 Build up
00:13:24 Also influences the PSD
00:13:41 How would you fix this
00:14:04 The background also needs to be stable
00:15:12 This will….
00:15:25 How much sample to add?
00:16:00 How much sample to add?
00:17:12 How does this change the result?
00:18:31 The sample also needs to be stable
00:20:46 Change the solvent
00:21:56 Also watch out for
00:22:21 And in the dry…
00:22:34 Other things to bear in mind
00:23:38 Dynamic Light Scattering
00:24:20 DLS Instrument Components
00:24:52 Intensity Fluctuations and Brownian Motion
00:25:28 Correlation in Dynamic Light Scattering
00:25:47 Correlation
00:26:00 Correlation
00:26:28 Correlation
00:26:47 Correlation Functions
00:27:08 The correlogram
00:29:50 Need a consistent signal
00:31:27 Poor signal to noise
00:32:19 Multiple scattering
00:33:15 Fluorescence
00:34:04 DLS – Intensity based
00:34:48 Conclusions
00:35:38 Thank you for your attentionQuestion & Answer SessionListening live:Ask your question by typing within the Q & A dialog boxListening on-demand:Send your questions toevents@malvernpanalytical.com

What are the most common mistakes made by scientists using technologies such as laser diffraction and dynamic light scattering to measure particle size?

How can these mistakes be avoided?

How can some of the most common causes of poor reproducibility be used to create experiments to validate your method?

This webinar will focus on the issues of unstable samples, poor backgrounds and poor analysis choices. None of these issues are complex, and awareness of potential issues and how to avoid them will result in significant improvements in the quality of your measurements.

演讲嘉宾

Steve Ward-Smith - Key Account Technical Specialist

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Who should attend?
Those actively using or considering using laser diffraction or dynamic light scattering to measure particle size for any application.

Scientists who want to improve the quality, speed and reliability of their particle sizing measurements, speeding their processes and making better products.